Abnormal device statistics on a brand new SSD 530

IIRCA4 — Thu, 06 Aug 2015 17:26:48 GMT

Hi All,

I just bought a new 120GB SSD 530 yesterday (SSDSC2BW120A4K5, orignal retail package), but the device statistics reported by smartctl seems abnormal:

The SMART values show that the drive was never used -- most are zeros, but some Device Statistics fields are not zero. For example, the "Logical Sectors Written" is 18343505 (8956MiB), and "Logical Sectors Read" is 16762989 (8185MiB), which are not sync with zeroed SMART "Host_Writes_32MiB", "Host_Reads_32MiB". The "Power-on Hours" field also has the same problem.

Does that mean that the drive wasn't correctly reset before shipping? firmware bug? or other issues?

Thanks.

The following are smartctl outputs

$ smartctl -x /dev/sdc

smartctl 6.4 2015-06-04 r4109 [x86_64-linux-3.13.0-43-generic] (local build)

=== START OF INFORMATION SECTION ===

Model Family: Intel 530 Series SSDs

Device Model: INTEL SSDSC2BW120A4

Serial Number: CVDA513204BC1207GN

LU WWN Device Id: 5 5cd2e4 04bfafa92

Firmware Version: DC32

User Capacity: 120,034,123,776 bytes [120 GB]

Sector Size: 512 bytes logical/physical

Rotation Rate: Solid State Device

Device is: In smartctl database [for details use: -P show]

ATA Version is: ACS-2 (minor revision not indicated)

SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)

Local Time is: Wed Aug 5 23:30:44 2015 CST

SMART support is: Available - device has SMART capability.

SMART support is: Enabled

AAM feature is: Unavailable

APM level is: 254 (maximum performance)

Rd look-ahead is: Enabled

Write cache is: Enabled

ATA Security is: Disabled, NOT FROZEN [SEC1]

Wt Cache Reorder: Unavailable

=== START OF READ SMART DATA SECTION ===

SMART overall-health self-assessment test result: PASSED

General SMART Values:

Offline data collection status: (0x05) Offline data collection activity

was aborted by an interrupting command from host.

Auto Offline Data Collection: Disabled.

Self-test execution status: ( 33) The self-test routine was interrupted

by the host with a hard or soft reset.

Total time to complete Offline

data collection: ( 2930) seconds.

Offline data collection

capabilities: (0x7f) SMART execute Offline immediate.

Auto Offline data collection on/off support.

Abort Offline collection upon new

command.

Offline surface scan supported.

Self-test supported.

Conveyance Self-test supported.

Selective Self-test supported.

SMART capabilities: (0x0003) Saves SMART data before entering

power-saving mode.

Supports SMART auto save timer.

Error logging capability: (0x01) Error logging supported.

General Purpose Logging supported.

Short self-test routine

recommended polling time: ( 1) minutes.

Extended self-test routine

recommended polling time: ( 48) minutes.

Conveyance self-test routine

recommended polling time: ( 2) minutes.

SCT capabilities: (0x0025) SCT Status supported.

SCT Data Table supported.

SMART Attributes Data Structure revision number: 10

Vendor Specific SMART Attributes with Thresholds:

ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE

5 Reallocated_Sector_Ct -O--CK 100 100 000 - 0

9 Power_On_Hours_and_Msec -O--CK 100 100 000 - 0h+26m+08.080s

12 Power_Cycle_Count -O--CK 100 100 000 - 1

170 Available_Reservd_Space PO--CK 100 100 010 - 0

171 Program_Fail_Count -O--CK 100 100 000 - 0

172 Erase_Fail_Count -O--CK 100 100 000 - 0

174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 0

183 SATA_Downshift_Count -O--CK 100 100 000 - 9

184 End-to-End_Error PO--CK 100 100 090 - 0

187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0

190 Airflow_Temperature_Cel -O--CK 033 034 000 - 33 (Min/Max 28/34)

192 Power-Off_Retract_Count -O--CK 100 100 000 - 0

199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0

225 Host_Writes_32MiB -O--CK 100 100 000 - 0

226 Workld_Media_Wear_Indic -O--CK 100 100 000 - 65535

227 Workld_Host_Reads_Perc -O--CK 100 100 000 - 47

228 Workload_Minutes -O--CK 100 100 000 - 65535

232 Available_Reservd_Space PO--CK 100 100 010 - 0

233 Media_Wearout_Indicator -O--CK 100 100 000 - 0

241 Host_Writes_32MiB -O--CK 100 100 000 - 0

242 Host_Reads_32MiB -O--CK 100 100 000 - 0

249 NAND_Writes_1GiB -O--CK 100 100 000 - 0

||||||_ K auto-keep

|||||__ C event count

||||___ R error rate

|||____ S speed/performance

||_____ O updated online

|______ P prefailure warning

General Purpose Log Directory Version 1

SMART Log Directory Version 1 [multi-sector log support]

Address Access R/W Size Description

0x00 GPL,SL R/O 1 Log Directory

0x04 GPL,SL R/O 1 Device Statistics log

0x06 SL R/O 1 SMART self-test log

0x07 GPL R/O 1 Extended self-test log

0x09 SL R/W 1 Selective self-test log

0x10 GPL R/O 1 SATA NCQ Queued Error log

0x11 GPL,SL R/O 1 SATA Phy Event Counters log

0x30 GPL,SL R/O 16 IDENTIFY DEVICE data log

0x80-0x9f GPL,SL R/W 16 Host vendor specific log

0xb7 GPL,SL VS 16 Device vendor specific log

0xe0 GPL,SL R/W 1 SCT Command/Status

0xe1 GPL,SL R/W 1 SCT Data Transfer

SMART Extended Comprehensive Error Log (GP Log 0x03) not supported

SMART Error Log not supported

SMART Extended Self-test Log Version: 0 (1 sectors)

Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error

# 1 Offline Interrupted (host reset) 10% 0 -

SMART Selective self-test log data structure revision number 0

Note: revision number not 1 implies that no selective self-test has ever been run

SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS

1 0 0 Not_testing

2 0 0 Not_testing

3 0 0 Not_testin...

Re: Abnormal device statistics on a brand new SSD 530

jbenavides — Fri, 07 Aug 2015 18:15:25 GMT

Hello mhtsai,

Thank you for using the Intel® Support Community. We reviewed the information and would like to inform that there is no problem with your new SSD, the values shown will not affect the expected endurance nor the performance of your SSD.

The best indicators of how much data has been read o written to the SSD are the SMART attributes: Total LBAs Written, Total LBAs Read and Total NAND Writes.

For a detailed explanation of the SMART attributes and other information, you can check thehttp://www.intel.com/content/dam/www/public/us/en/documents/product-specifications/ssd-530-sata-specification.pdf Intel® SSD 530 Series (2.5-inch) Product Specification.

Re: Abnormal device statistics on a brand new SSD 530

IIRCA4 — Sat, 08 Aug 2015 06:46:45 GMT

Hi Jonathan,

Thank you for your reply. Could you help to explain what circumstance could cause this situation?

Initially, I though that it was caused by the automated SMART test at drive start. According to this thread, the Intel SSD 530 runs automated SMART test at drive reset: /thread/48469 https://communities.intel.com/thread/48469. But, on my two other SSD 730 drives, the SMART test increases "Total LBAs Read" and "Logical Sectors Read" simultaneously.

I also cannot find a smartctl report like my case. So it would be help if you can provide more information.

Thanks

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Abnormal device statistics on a brand new SSD 530

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Re: Abnormal device statistics on a brand new SSD 530